Metrology - Applicable anywhere, impressive everywhere

Metrology - applicable anywhere, impressive everywhere

Whether in the geodesy, photogrammetry, laser tracking, scanning or the quality assurance:

The optical measuring systems of Berliner Glas convince in the optical metrology through flexibility and precision. Therefore there is no object too big, too small or too complex to not to be measured.

• Optical systems for measuring building facades or airplanes
• Optical systems to image three-dimensionally, the earth´s surface
• Optical systems for innovative and laser-based metrology
  

System engineering	Optical and mechanical design
Coating design	Customer-specific metrology

Material: optical glass, CaF2, MgF2, quartz, glassceramics, ceramic, borosilicate glass und filter glass

 Spherical lenses

Dimensions	up to Ø 500 mm
Radii	1.2 mm upwards (without limit)
Centering error	10"
Fitting error	λ/40 PV, measured at 632.8 nm
Surface error	5/1 x 0.025
Micro roughness	2 Å rms
Average thickness tolerance	+/- 3 µm
Diameter tolerance	+/- 3 µm

 Aspherical lenses

Dimensions	Ø 5 - 150 mm
Fitting error	λ/20 PV, convex und concave, direct interferometric measurement

 Cylindrical lenses

Radii	2 - 50,000 mm
Length	up to 500 mm, larger on request
Lens width	up to 300 mm (depending on the focal length)
Fitting error	λ/8 PV, measured at 632.8 nm
Surface error	5/1 x 0.025
Micro roughness	2 Å rms
Centering	Rotation: 10", offset: 4 µm, wedge: 3µm

Plano optics

 Windows, prisms and prism systems

Dimensions	up to max. 1,500 mm
Flatness	λ/40 PV, measured at 632.8 nm
Parallelism	1"
Angular accuracy	1"
Micr roughness	2 Å rms
Surface defects	5/1 x 0.004

Microstructuring

• Reticules, masks, coded and analog circles
• Structured coatings
  

Coating

Coating design

Spectral range: VUV, DUV, UV, VIS,      NIR, IR correspondingly approx. 130 - 6.000 nm

Anti-reflex coatings

Broadband

V-coatings

W-coatings

Filters

Edge filter	Band-pass filter
Gradient filter (neutral density filter)

Mirrors

Metallic mirrors	Dielectric mirrors
Laser mirrors with high damage threshold

Beam splitter/combiner (cemented/uncemented)

Polarising (polarisers)

Non-polarising

Color splitter

ITO coating

Holographic gratings

• Optical assemblies and systems (cemented beam splitter, prim systems, doublets, triplets, step systems)
• Optomechanical assemblies and systems
• Elektro-optical systems
• Lens systems
• Objectives, zoom systems
• Measuring systems
• Cameras
• Laser systems
• Light sources
• Lighting systems
  

Wavefront	Interferometer (4 - 24"), Shack-Hartmann wavefront sensor (UV, DUV, VIS, NIR)
Form deviation	3D coordinate measuring devices, calliper, CCD micrometers, Stitching interferometer
Angle precision	Goniometer, interferometer, autocollimators
Transmission/reflection	Spektral photometer
Surface defects	Traveling microscopes
Micro roughness	White light interferometer, atomic force microscope
Imaging performance/resolution	Computer-supported MTF-measurement, microscopic image resolution
Centering	Objective metrology system, laser centering station
Additional functional measurement	Assembly-specific metrology station
Fine correcting procedure	Ionic beam process, robotic polishing, magnetorheological process

^{*The following error and tolerance data indicates possible limit values. Specified and
assessed according to ISO/MIL/DIN.}