|
|
 |
Interferogram
|
|
Metrology is an important step in our production process. High quality requires constant control and therefore, individual development of appropriate measurement set-ups and sofware adaptation is a matter of course.
With comprehensive instrumentation technology, we always try to meet our customers' individual profile. |
| Wavefront | Interferometer 4-24”, Shack-Hartmann-Wavefront-Sensor (UV, DUV, VIS, NIR) | | Form deviation | 3D-coordinate measurement, Caliper, CCD-Micrometer, Stitching interferometer | | Angle precision | Goniometer, interferometer | | Transmission/reflection | Spectrophotometer, diode array | | Surface defects | Automatic traveling microscope | | Micro roughness | White light interferometer, AFM | | Imaging performance/resolution | Computer-supported MTF-measurement, microscope picture resolution test | | Centering | Objective metrology station, laser centering station | | Additional functional measurement | Assembly-specific metrology station |
|
|
|
Deutsche Version
